Tue 6 Nov 2018 15:30 - 15:52 at Horizons 5 - Testing I Chair(s): David Lo

Combinatorial testing (CT) has been proven effective in revealing the failures caused by the interaction of factors that affect the behavior of a system. The theory of Minimal Failure-Causing Schema (MFS) has been proposed to isolate the cause of a failure after CT. Most algorithms that aim to identify MFS focus on handling a single fault in the System Under Test (SUT). However, we argue that multiple faults are more common in practice, under which masking effects may be triggered so that some failures cannot be observed. The traditional MFS theory lacks a mechanism to handle such effects; hence, they may incorrectly isolate the MFS. To address this problem, we propose a new MFS model that takes into account multiple faults. We first formally analyze the impact of the multiple faults on existing MFS identifying algorithms, especially in situations where masking effects are triggered by multiple faults. We then develop an approach that can assist traditional algorithms to better handle multiple faults. Empirical studies were conducted using several kinds of open-source software, which showed that multiple faults with masking effects do negatively affect traditional MFS identifying approaches and that our approach can help to alleviate these effects.

Tue 6 Nov

Displayed time zone: Guadalajara, Mexico City, Monterrey change

15:30 - 17:00
Testing IJournal-First / Research Papers at Horizons 5
Chair(s): David Lo Singapore Management University
15:30
22m
Talk
Identifying failure-causing schemas in the presence of multiple faults
Journal-First
Xintao Niu , Changhai Nie , Yu Lei , Hareton Leung , Xiaoyin Wang University of Texas at San Antonio, USA
DOI
15:52
22m
Talk
Singularity: Pattern Fuzzing for Worst Case Complexity
Research Papers
Jiayi Wei University of Texas at Austin, Jia Chen University of Texas at Austin, Yu Feng University of California, Santa Barbara, USA, Kostas Ferles UT Austin, Isil Dillig UT Austin
DOI Pre-print
16:15
22m
Talk
Bug Synthesis: Challenging Bug-Finding Tools with Deep Faults
Research Papers
Subhajit Roy IIT Kanpur, India, Awanish Pandey IIT Kanpur, India, Brendan Dolan-Gavitt New York University, Yu Hu New York University, USA
16:37
22m
Talk
Modify, Enhance, Select: Co-Evolution of Combinatorial Models and Test Plans
Research Papers
Rachel Tzoref-Brill IBM Research, Shahar Maoz Tel Aviv University